Workshops & Trainings

This workshop is aimed at all individual and groups that have a deep interest in data quality
questions in single crystal diffraction experiments. These may be diffractometer sellers, application scientists, software developers, beam line scientists, neutron diffraction scientists, and academics applying crystallographic techniques, crystallographic databank providers, developers of hardware like detectors and editors of crystallographic journals.

The workshop serves to deepen the understanding of the appearance and measurement of
systematic errors in single crystal diffraction experiments. Strategies to discover systematic errors and to identify and remove these are discussed. The important topic of how standard data quality procedures are themselves biased and the consequences are also discussed.
Well established and also more recent metrics are discussed in greater detail and applied to real world data.

Some characteristic differences in the appearance of systematic errors for different diffractometer brands will be discussed at the end if enough time is available.